Skip to content

Solution To Resolve Depth Error Using TOFD Parallel Scan

Webinars 12 April 2025

Join us for an insightful webinar on Time-of-Flight Diffraction (TOFD), focusing on depth errors caused by lateral uncertainty in defect location and how parallel scanning can help resolve this issue. This session will cover:

  • TOFD Basics – Understanding wave nature and general setup.
  • TOFD Errors & Dead Zones – Common challenges and their impact.
  • Scan Types – Applications and requirements for different scenarios.
  • Parallel Scan – Data acquisition, analysis, and its advantages & limitations.

Gain valuable insights from industry experts and enhance your TOFD knowledge. Register now!

Speakers

Sathish Murugan -

Sathish Murugan


Mr Sathish Murugan Holds M.Tech Degree in NDT From the National Institute of Technology. He has extensive knowledge in advanced NDE Technologies like Phased Array Ultrasonic, Automated ultrasonic testing-Pipeline, Time of Flight Diffraction, Eddy Current Testing and Tube Inspection Techniques. He has been actively involved in the application of various conventional and advanced NDT techniques for inspection at pre-service & in-service stages in Refineries, Power Plants, Chemical & fertilizer industries etc. He has vast experience in offshore/onshore pipeline AUT projects at various levels.